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Solutions since 1954

Equotip

Equotip

Equotip
Equotip
Equotip

Leading portable hardness testing solutions

Leeb, Rockwell and UCI

Proceq's Equotip enable the inspection of almost any object, polished parts and heat-treated surfaces. The hardness measurements are made by using the dynamic rebound testing method according to Leeb, the static Portable Rockwell hardness test and the Ultrasonic Contact Impedance (UCI) method. The rugged Swiss Made hardness testers are designed for portable hardness testing in the lab, in the workshop, at production facilities or on site. Proceq's latest innovation is Equotip Live featuring a wireless impact device, mobile app, real-time data sharing and cloud backup.

Since Proceq invented the Leeb test principle in 1975, Equotip has become established as a globally recognized measuring technique for portable hardness testing and a de facto industry standard. A wide range of different impact devices, as well as a comprehensive selection of test blocks and accessories cover most applications.

Equotip 550 UCI
Equotip 550 Portable Rockwell
Equotip 550 Leeb
Equotip Piccolo / Bambino 2
Description
Description

Flexible UCI hardness tester for fine-grained material with any shape and heat-treated surfaces. The patented adjustable test load enables a wide range of applications. Rugged touchscreen with enhanced software features and analysis functions. 

Description

Portable Rockwell hardness tester for scratch-sensitive, polished and thin parts. It features excellent sensitivity through small penetration of a few micrometer. Rugged touchscreen with enhanced software features and analysis functions. 

Description

Versatile Leeb hardness tester for on-site testing of heavy, large or installed parts. Rugged touchscreen designed to provide an exceptional user experience and best possible measuring and analysis. Enhanced software features and analysis functions. 

Description

Fully integrated and handy Leeb hardness tester with a compact and robust housing. Ideally suited for quick on-site hardness tests. Optional DL probe for confined spaces and recessed surfaces. Equotip Piccolo 2 allows the transfer of the data to a PC. 

Your Benefits
Your Benefits
Combine with Leeb and Portable Rockwel

Combine with Leeb and Portable Rockwel

On-screen feedback to reduce measurement inaccuracies caused by the operator

On-screen feedback to reduce measurement inaccuracies caused by the operator

Ready-to-go reports through powerful built-in reporting feature

Ready-to-go reports through powerful built-in reporting feature

Your Benefits
Combine with Leeb and UCI

Combine with Leeb and UCI

Equally reliable, accurate and standardized but faster than stationary Rockwell hardness testers

Equally reliable, accurate and standardized but faster than stationary Rockwell hardness testers

Ready-to-go reports through powerful built-in reporting feature

Ready-to-go reports through powerful built-in reporting feature

Your Benefits
Use full Leeb probe portfolio and combine with Portable Rockwell and UCI

Use full Leeb probe portfolio and combine with Portable Rockwell and UCI

Comes with the high accuracy known for all Equotip  products

Comes with the high accuracy known for all Equotip products

Ready-to-go reports through powerful built-in reporting feature

Ready-to-go reports through powerful built-in reporting feature

Your Benefits
Entry model for quick on-site tests

Entry model for quick on-site tests

Compact housing and automatic angle correction allow flexible use

Compact housing and automatic angle correction allow flexible use

Comes with the high accuracy known for all Equotip products

Comes with the high accuracy known for all Equotip products

Native Scale
Native Scale

HV (UCI)

Native Scale

µm, µinch

Native Scale

HL

Native Scale

HL

Measuring Range
Measuring Range

20 - 2000 HV

Measuring Range

0 - 100 µm; 19 - 70 HRC; 35 - 1‘000 HV

Measuring Range

150 - 950 HL

Measuring Range

150 – 950 HL

Measuring Accuracy
Measuring Accuracy

± 2% (150 - 950 HV)

Measuring Accuracy

± 0.8 µm; ~ ± 1.0 HRC

Measuring Accuracy

± 4 HL (0.5% at 800 HL)

Measuring Accuracy

± 4 HL (0.5% at 800 HL)

Available Scales
Available Scales

HB, HV, HRA, HRB, HRC, HR15N, HR15T, MPA

Available Scales

HB, HV, HRA, HRB, HRC, R15N, HR15T, HMMRC, MPA

Available Scales

HB, HV, HRA, HRB, HRC, HS, MPA

Available Scales

HB, HV, HRB, HRC, HS, MPA (Equotip Piccolo 2 only)

Available Probes
Available Probes

UCI (Adjustable HV1 - HV5)

Available Probes

Portable Rockwell (50N)

Available Probes

Leeb D / DC / DL / S / E / G / C

Available Probes

Leeb D / DL

Combination With Other Methods
Combination With Other Methods

Leeb, Portable Rockwell

Combination With Other Methods

Leeb, UCI

Combination With Other Methods

Portable Rockwell, UCI

Combination With Other Methods
Average Roughness Ra (µm / µinch)
Average Roughness Ra (µm / µinch)

12.5 / 500

Average Roughness Ra (µm / µinch)

2 / 80

Average Roughness Ra (µm / µinch)

7 / 275 (Leeb G)

Average Roughness Ra (µm / µinch)

2 / 80

Minimum Mass (kg / lbs)
Minimum Mass (kg / lbs)

0.3 / 0.66

Minimum Mass (kg / lbs)

No requirement

Minimum Mass (kg / lbs)

0.02 / 0.045 (Leeb C)

Minimum Mass (kg / lbs)

0.05 / 0.2

Minimum Thickness (mm / inch)
Minimum Thickness (mm / inch)

5 / 0.2

Minimum Thickness (mm / inch)

10 x indendation depth

Minimum Thickness (mm / inch)

1 / 0.04 (Leeb C)

Minimum Thickness (mm / inch)

3 / 0.12

Equotip 550 UCI
Equotip 550 Portable Rockwell
Equotip 550 Leeb
Equotip Piccolo / Bambino 2
Standard to large objects
Standard to large objects
Standard to large objects
Standard to large objects
Standard to large objects
Round objects
Round objects
Round objects
Round objects
In combination with support rings
Round objects
In combination with support rings
Light objects
Light objects
Light objects
Light objects
With impact device Leeb C
Light objects
Very hard objects
Very hard objects
Very hard objects
Very hard objects
With impact devices Leeb S and E
Very hard objects
Cast objects
Cast objects
Cast objects
Cast objects
With impact device Leeb G
Cast objects
Polished objects
Polished objects
Polished objects
Polished objects
With impact device Leeb C
Polished objects
Limited accessibility
Limited accessibility
Limited accessibility
Limited accessibility
With impact devices Leeb DC and DL
Limited accessibility
With impact device Leeb DL
Thin objects
Thin objects
Thin objects
Thin objects
Thin objects
Heat treated surfaces
Heat treated surfaces
Heat treated surfaces
Heat treated surfaces
Heat treated surfaces
Automotive
Automotive
Aerospace
Aerospace
Academics, research and education
Academics, research and education
Energy
Energy
Manufacturing and machinery
Manufacturing and machinery
Oil & Gas
Oil & Gas
Railways
Railways
Equotip 550 UCI
Equotip 550 Portable Rockwell
Equotip 550 Leeb
Equotip Piccolo / Bambino 2
Instrument Firmware
Instrument Firmware
  • Profile view
  • One-step calibration
  • Automatic compensation for impact direction
  • Personalized user profiles and views
  • Integration in automated testing environments (incl. remote control)
  • 11 Languages and timezone supported
Instrument Firmware
  • Personalized user profiles and views
  • Integration in automated testing environments (incl. remote control)
  • 11 Languages and timezone supported
Instrument Firmware
  • Automatic compensation for impact direction
  • Personalized user profiles and views
  • Integration in automated testing environments (incl. remote control)
  • 11 Languages and timezone supported
Instrument Firmware
  • Automatic compensation for impact direction
  • Integration in automated testing environments (incl. remote control): Equotip Piccolo 2 only
  • Language independent
PC Software
PC Software

Equotip Link allowing direct reporting and custom reports

PC Software

Equotip Link allowing direct reporting and custom reports

PC Software

Equotip Link allowing direct reporting and custom reports

PC Software

Piccolink software (Equotip Piccolo 2 only)

Display
Display

7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor

Display

7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor

Display

7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor

Display

Monochrome 4-digit

Memory
Memory

Internal 8 GB flash memory (> 1’000’000 measurements)

Memory

Internal 8 GB flash memory (> 1’000’000 measurements)

Memory

Internal 8 GB flash memory (> 1’000’000 measurements)

Memory

32 KB (~ 2’000 readings) (Equotip Piccolo 2 only)

Connections
Connections

USB host / device and Ethernet

Connections

USB host / device and Ethernet

Connections

USB host / device and Ethernet

Connections

USB interface to PC

Equotip 550 UCI
Equotip 550 Portable Rockwell
Equotip 550 Leeb
Equotip Piccolo / Bambino 2
Standards
Standards
  • DIN 50159
  • ASTM A 1038
Standards
  • DIN 50157
Standards
  • ASTM A 956
  • ASTM E 140
  • ASTM A 370
  • ISO 16859
  • DIN 50156
  • GB/T 17394
  • JB/T 9378
Standards
  • ASTM A 956
  • ASTM E 140
  • ASTM A 370
  • ISO 16859
  • DIN 50156
  • GB/T 17394
  • JB/T 9378
Guidelines
Guidelines
  • ASME CRTD-91
  • DGZfP Guideline MC 1
  • VDI / VDE Guideline 2616 Paper 1
  • Nordtest Technical Reports 424-1, 424-2, 424-3
Guidelines
  • DGZfP Guideline MC 1
  • VDI / VDE Guideline 2616 Paper 1
  • Nordtest Technical Reports 424-1, 424-2, 424-3
Guidelines
  • ASME CRTD-91
  • DGZfP Guideline MC 1
  • VDI / VDE Guideline 2616 Paper 1
  • Nordtest Technical Reports 424-1, 424-2, 424-3
Guidelines
  • ASME CRTD-91
  • DGZfP Guideline MC 1
  • VDI / VDE Guideline 2616 Paper 1
  • Nordtest Technical Reports 424-1, 424-2, 424-3
Equotip 550 UCI
Equotip 550 Portable Rockwell
Equotip 550 Leeb
Equotip Piccolo / Bambino 2
Measurement Accessories
Measurement Accessories
  • Equotip UCI Special Foot
  • Special 2-in-1 kits
Measurement Accessories
  • Equotip Portable Rockwell Measuring Clamp
  • Equotip Portable Rockwell Spezialfuss RZ 18 mm - 70 mm
  • Equotip Portable Rockwell Spezialfuss RZ 70 mm - ∞
  • Special 2-in-1 kits
Measurement Accessories
  • Set of support rings 12 pcs. for D/DC/D+15/C/E/S)
  • Equotip Leeb Impact Device S
  • Equotip Leeb Impact Device DL
  • Special 2-in-1 kits
Measurement Accessories
  • Equotip Piccolo 2/Bambino 2 DL Accessory Kit
  • Set of support rings 12 pcs. for D/DC/D+15/C/E/S)
Verification Tools
Verification Tools
Verification Tools
Verification Tools
Verification Tools

Equotip Test Block D/DC, ~775 HLD / ~56 HRC, Proceq Factory Calibration

Equotip 550 UCI
Equotip 550 Portable Rockwell
Equotip 550 Leeb
Equotip Piccolo / Bambino 2
Product videos