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| Testing method | Leeb rebound |
| Impact energy | 11 Nmm (Equotip D probe) |
| Spherical test tip | Tungsten carbide, 3 mm diameter |
| Min. radius of surface curvature | 10 mm |
| Testing range | 150 - 950 HL |
| Resolution | 1 HL; 1 HV; 1 HB; 0.1 HRC; 0.1 HRB; 0.1 HS |
| Accuracy | ± 4 HL (0.5% at 800 HL) |
| Dimensions | 147.5 x 44 x 20 mm (5.71 x 1.75 x 0.79 in.) |
| Weight | 110 g |
| Housing material | scratch proofed anodized aluminum |
| Display | large, high contrast LCD |
| Internal data storage | N/A |
| Communication | N/A |
| PC application | N/A |
| Battery | Li ion, charges through device USB port, over ~ 20,000 impacts on a full charge, intelligent wake-up/sleep mode |
| Operating temperature | -10 to +60 °C (14 to 140 °F) |
| Humidity | 90% max. |