
Equotip portable hardness testers – Leeb, Rockwell & UCI
Overcome the limitations of stationary bench top metal NDT hardness testing
Proceq's Equotip enables portable hardness inspection of almost any object, polished parts and heat-treated surfaces. The hardness measurements are made by using the dynamic rebound testing method according to Leeb, the static Portable Rockwell hardness test and the Ultrasonic Contact Impedance (UCI) method. The rugged Swiss-made metal NDT hardness testers are designed for portable hardness testing in the lab, in the workshop, at production facilities or on site. Proceq's latest innovation is Equotip Live featuring a wireless impact device, mobile app, real-time data sharing and cloud backup.
Since Proceq invented the Leeb hardness test principle in 1975, Equotip has become established as a globally recognized brand for portable hardness testing and a de facto industry standard. A wide range of different impact devices, as well as a comprehensive selection of test blocks and accessories cover most applications.
![]() Equotip Live UCI |
![]() Equotip Live Leeb D |
![]() Equotip 550 UCI |
![]() Equotip 550 Portable Rockwell |
![]() Equotip 550 Leeb |
![]() Equotip Piccolo / Bambino 2 |
Equotip Live UCI |
Equotip Live Leeb D |
Equotip 550 UCI |
Equotip 550 Portable Rockwell |
Equotip 550 Leeb |
Equotip Piccolo / Bambino 2 |
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Description |
Description
Equotip Live UCI creates new opportunities for collaboration in portable hardness testing. The Equotip iOS app allows you to conduct measurements at a remote location and provide instant access of your results to your team. |
Description
The world’s first full IoT portable wireless hardness testing solution with real-time data sharing, cloud backup and intuitive user interface. The ultra portable Equotip Live Leeb D impact device is perfect for use in confined spaces. |
Description
Flexible UCI hardness tester for fine-grained material with any shape and heat-treated surfaces. The patented adjustable test load enables a wide range of applications. Rugged touchscreen with enhanced software features and analysis functions. Equotip 540 for regular basic usage without extensive reporting needs. |
Description
Portable Rockwell hardness tester for scratch-sensitive, polished and thin parts. It features excellent sensitivity through small penetration of a few micrometer. Rugged touchscreen with enhanced software features and analysis functions. |
Description
Versatile Leeb hardness tester for on-site testing of heavy, large or installed parts. Rugged touchscreen designed to provide an exceptional user experience and best possible measuring and analysis. Enhanced software features and analysis functions. Equotip 540 for regular basic usage without extensive reporting needs. |
Description
Fully integrated and handy Leeb hardness tester with a compact and robust housing. Ideally suited for quick on-site hardness tests. Optional DL probe for confined spaces and recessed surfaces. Equotip Piccolo 2 allows the transfer of the data to a PC. |
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Your Benefits |
Your Benefits
![]() Wireless UCI probe ![]() Instantly share your measurements and reports ![]() Logbook for full data traceability |
Your Benefits
![]() Wireless impact device and clean user-interface ![]() Easily share your measurements and reports in real-time worldwide ![]() Logbook for full data traceability and to add media |
Your Benefits
![]() Combine with Leeb and Portable Rockwel ![]() On-screen feedback to reduce measurement inaccuracies caused by the operator ![]() Ready-to-go reports through powerful built-in reporting feature |
Your Benefits
![]() Combine with Leeb and UCI ![]() Equally reliable, accurate and standardized but faster than stationary Rockwell hardness testers ![]() Ready-to-go reports through powerful built-in reporting feature |
Your Benefits
![]() Use full Leeb probe portfolio and combine with Portable Rockwell and UCI ![]() Comes with the high accuracy known for all Equotip products ![]() Ready-to-go reports through powerful built-in reporting feature |
Your Benefits
![]() Entry model for quick on-site tests ![]() Compact housing and automatic angle correction allow flexible use ![]() Comes with the high accuracy known for all Equotip products |
Native Scale |
Native Scale
HV (UCI) |
Native Scale
HL |
Native Scale
HV (UCI) |
Native Scale
µm, µinch |
Native Scale
HL |
Native Scale
HL |
Available Scales |
Available Scales
HB, HV, HLD, HRA, HRB, HRC, HR15N, HR15T, MPA |
Available Scales
HB, HV, HRB, HRC, HS, MPA |
Available Scales
HB, HV, HRA, HRB, HRC, HR15N, HR15T, MPA |
Available Scales
HB, HV, HRA, HRB, HRC, R15N, HR15T, HMMRC, MPA |
Available Scales
HB, HV, HRA, HRB, HRC, HS, MPA |
Available Scales
HB, HV, HRB, HRC, HS, MPA (Equotip Piccolo 2 only) |
Available Probes |
Available Probes
Universal probe with adjustable test load between HV1 and HV10 |
Available Probes
Leeb D |
Available Probes
UCI (Adjustable HV1 - HV5) |
Available Probes
Portable Rockwell Probe 50N (can also be connected directly to PC) |
Available Probes
Leeb D / DC / DL / S / E / G / C |
Available Probes
Leeb D / DL |
Combination With Other Methods |
Combination With Other Methods
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Combination With Other Methods
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Combination With Other Methods
Leeb, Portable Rockwell |
Combination With Other Methods
Leeb, UCI |
Combination With Other Methods
Portable Rockwell, UCI |
Combination With Other Methods
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Average Roughness Ra (µm / µinch) |
Average Roughness Ra (µm / µinch)
12.5 / 500 |
Average Roughness Ra (µm / µinch)
2 / 80 |
Average Roughness Ra (µm / µinch)
12.5 / 500 |
Average Roughness Ra (µm / µinch)
2 / 80 |
Average Roughness Ra (µm / µinch)
7 / 275 (Leeb G) |
Average Roughness Ra (µm / µinch)
2 / 80 |
Minimum Mass (kg / lbs) |
Minimum Mass (kg / lbs)
0.3 / 0.66 |
Minimum Mass (kg / lbs)
0.05 / 0.2 |
Minimum Mass (kg / lbs)
0.3 / 0.66 |
Minimum Mass (kg / lbs)
No requirement |
Minimum Mass (kg / lbs)
0.02 / 0.045 (Leeb C) |
Minimum Mass (kg / lbs)
0.05 / 0.2 |
Minimum Thickness (mm / inch) |
Minimum Thickness (mm / inch)
5 / 0.2 |
Minimum Thickness (mm / inch)
3 / 0.12 |
Minimum Thickness (mm / inch)
5 / 0.2 |
Minimum Thickness (mm / inch)
10 x indendation depth |
Minimum Thickness (mm / inch)
1 / 0.04 (Leeb C) |
Minimum Thickness (mm / inch)
3 / 0.12 |
Equotip Live UCI |
Equotip Live Leeb D |
Equotip 550 UCI |
Equotip 550 Portable Rockwell |
Equotip 550 Leeb |
Equotip Piccolo / Bambino 2 |
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Standard to large objects |
Standard to large objects
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Standard to large objects
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Standard to large objects
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Standard to large objects
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Standard to large objects
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Standard to large objects
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Round objects |
Round objects
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Round objects
In combination with support rings
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Round objects
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Round objects
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Round objects
In combination with support rings
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Round objects
In combination with support rings
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Light objects |
Light objects
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Light objects
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Light objects
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Light objects
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Light objects
With impact device Leeb C
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Light objects
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Very hard objects |
Very hard objects
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Very hard objects
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Very hard objects
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Very hard objects
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Very hard objects
With impact devices Leeb S and E
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Very hard objects
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Cast objects |
Cast objects
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Cast objects
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Cast objects
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Cast objects
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Cast objects
With impact device Leeb G
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Cast objects
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Polished objects |
Polished objects
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Polished objects
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Polished objects
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Polished objects
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Polished objects
With impact device Leeb C
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Polished objects
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Limited accessibility |
Limited accessibility
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Limited accessibility
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Limited accessibility
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Limited accessibility
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Limited accessibility
With impact devices Leeb DC and DL
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Limited accessibility
With impact device Leeb DL
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Thin objects |
Thin objects
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Thin objects
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Thin objects
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Thin objects
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Thin objects
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Thin objects
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Heat treated surfaces |
Heat treated surfaces
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Heat treated surfaces
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Heat treated surfaces
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Heat treated surfaces
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Heat treated surfaces
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Heat treated surfaces
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Additional Applications |
Additional Applications
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Additional Applications
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Additional Applications
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Additional Applications
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Additional Applications
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Additional Applications
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Equotip Live UCI |
Equotip Live Leeb D |
Equotip 550 UCI |
Equotip 550 Portable Rockwell |
Equotip 550 Leeb |
Equotip Piccolo / Bambino 2 |
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Instrument Firmware |
Instrument Firmware
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Instrument Firmware
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Instrument Firmware
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Instrument Firmware
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Instrument Firmware
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Instrument Firmware
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PC Software |
PC Software
Webbrowser-based Equotip Live solution |
PC Software
Webbrowser-based Equotip Live solution |
PC Software
Equotip Link allowing direct reporting and custom reports |
PC Software
Equotip Link allowing direct reporting and custom reports |
PC Software
Equotip Link allowing direct reporting and custom reports |
PC Software
Piccolink software (Equotip Piccolo 2 only) |
Display |
Display
Any compatible Apple® iPad (iOS 8.0 and higher) |
Display
Any iOS device (not included in the delivery) |
Display
7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor |
Display
7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor |
Display
7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor |
Display
Monochrome 4-digit |
Memory |
Memory
Memory of iOS device |
Memory
Memory of iOS device |
Memory
Internal 8 GB flash memory (> 1’000’000 measurements) |
Memory
Internal 8 GB flash memory (> 1’000’000 measurements) |
Memory
Internal 8 GB flash memory (> 1’000’000 measurements) |
Memory
32 KB (~ 2’000 readings) (Equotip Piccolo 2 only) |
Connections |
Connections
USB for charging and updates |
Connections
USB for charging and updates |
Connections
USB host / device and Ethernet |
Connections
USB host / device and Ethernet |
Connections
USB host / device and Ethernet |
Connections
USB interface to PC |
Measuring Range |
Measuring Range
20 – 2000 HV |
Measuring Range
150 - 950 HL |
Measuring Range
20 - 2000 HV |
Measuring Range
0 - 100 µm; 19 - 70 HRC; 35 - 1‘000 HV |
Measuring Range
150 - 950 HL |
Measuring Range
150 – 950 HL |
Measuring Accuracy |
Measuring Accuracy
± 2% (150 – 950 HV) |
Measuring Accuracy
± 4 HL (0.5% at 800 HL) |
Measuring Accuracy
± 2% (150 - 950 HV) |
Measuring Accuracy
± 0.8 µm; ~ ± 1.0 HRC |
Measuring Accuracy
± 4 HL (0.5% at 800 HL) |
Measuring Accuracy
± 4 HL (0.5% at 800 HL) |
Equotip Live UCI |
Equotip Live Leeb D |
Equotip 550 UCI |
Equotip 550 Portable Rockwell |
Equotip 550 Leeb |
Equotip Piccolo / Bambino 2 |
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Standards |
Standards
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Standards
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Standards
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Standards
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Standards
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Standards
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Guidelines |
Guidelines
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Guidelines
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Guidelines
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Guidelines
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Guidelines
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Guidelines
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Equotip Live UCI |
Equotip Live Leeb D |
Equotip 550 UCI |
Equotip 550 Portable Rockwell |
Equotip 550 Leeb |
Equotip Piccolo / Bambino 2 |
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Measurement Accessories |
Measurement Accessories
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Measurement Accessories
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Measurement Accessories
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Measurement Accessories
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Measurement Accessories
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Measurement Accessories
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Verification Tools |
Verification Tools
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Verification Tools
Equotip Test Block D/DC, ~775 HLD / ~56 HRC, Factory Calibrations by Proceq (357 13 100) |
Verification Tools
Equotip UCI Test Block ~850HV, ISO 6507-3 HV5 Calibration (357 54 100) |
Verification Tools
Equotip Portable Rockwell Test Block ~62 HRC, ISO 6508-3 HRC Calibration (357 44 100) |
Verification Tools
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Verification Tools
Equotip Test Block D/DC, ~775 HLD / ~56 HRC, Proceq Factory Calibration (357 13 100) |
Equotip Live UCI |
Equotip Live Leeb D |
Equotip 550 UCI |
Equotip 550 Portable Rockwell |
Equotip 550 Leeb |
Equotip Piccolo / Bambino 2 |
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Documents |
Documents
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Documents
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Documents
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Documents
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Documents
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Documents
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Software |
Software
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Software
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Software
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Software
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Software
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Software
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Media |
Media
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Media
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Media
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Media
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Media
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Media
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Equotip Live UCI |
Equotip Live Leeb D |
Equotip 550 UCI |
Equotip 550 Portable Rockwell |
Equotip 550 Leeb |
Equotip Piccolo / Bambino 2 |
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Send Request | Send Request | Send Request | Send Request | Send Request | Send Request |